Equipment
ScatterX78
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
X-RAY Diffractometer with HT chamber
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…
Universal testing machine Instron 5982
Contact person:
Cios Grzegorz
Technical description:
Maximum load 100 kN. Working area height 1430 mm. Force measurement accuracy +/- 0.5% of reading down to 1/500th of the measuring head range (measuring head series 2580). Data acquisition with a sampling rate of up to 1 kHz simultaneously for force,…
FT-NMT04 in-situ Nanoindenter
Contact person:
Kawałko Jakub
Technical description:
The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…
Pin-on-disk tribometer TRB³ Anton Paar
Contact person:
Gajewska Marta
Technical description:
The device allows you to test tribological properties of a wide range of materials in various modes of: movement (linear, reciprocating), contact (pin, ball), speed and lubrication.
The tribometer is characterized by the following operating param…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
Nanoindenter G200 Agilent - KLA
Contact person:
Cios Grzegorz
Technical description:
Testing machine for hardness and Young's modulus on the nanometre scale, with a load range of up to 9.8 N (in high load mode). Equipped with a CSM (Continuous Stiffness Measurement) module for continuous measurement of Young's modulus and ha…
Universal testing machine INSTRON 600DX
Contact person:
Cios Grzegorz
Technical description:
Maximum load - 600 kN. Working speed range from 0.1 to 76 mm/min. Strain gauge measuring heads 100 and 600 kN with measuring accuracy class 0.5 and linearity of at least +/- 0.25 % of the measured value in the range 0.4 % to 100 % of the measuring r…
Universal testing machine INSTRON 5966
Contact person:
Cios Grzegorz
Technical description:
Maximum load 10 kN. Equipped additionally with a head up to 1 kN and pneumatic jaws with a set of inserts (e.g. for ribbons testing).
