Equipment

Technical description: Ultra-high resolution scanning electron microscope equipped with field emission  electron gun (FEG - Schotky’s  emitter), coupled with EDS by EDAX. Threshold resolution 2 nm, magnification range 70 – 500 000x.

Technical description: SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…