Scanning Electron Microsocpe JEOL JSM-6490LA
The JEOL JSM-6490LA scanning electron microscope with a LaB6 electron gun and an ion pumping system. The microscope is equipped with both backscattered electron (BSE) and secondary electron (SE) detectors, as well as an EBSD (Electron Back Scattered Diffraction) system for crystallographic orientation analysis. Observations in high (HV) and low (LV) vacuum conditions are possible. Resolution (according to the manufacturer) of 3 nm (at 30 kV, WD 8 mm, SE). The microscope also allows for the installation of a micro-testing machine and its tilt at an angle of 70° to the beam axis (for the EBSD analysis).
– With the consent of the equipment supervisor.
– Scientific collaboration between AGH entities and other domestic and foreign research institutions.
– Collaboration carried out within the framework of domestic and international research projects, as well as within research agreements with industry.
- High-resolution characterization of crystalline materials
- High-resolution imaging of minerals, synthetic and biological materials.
- Crystallographic orientation mapping.
- Mechanical testing and in-situ measurements of crystalline lattice strain.
Image registration by:
- Secondary electrons: topographic contrast.
- Backscattered electrons: Z-difference and orientation contrast.
- Kikuchi diffraction.
Specification:
- Resolution (according to the manufacturer): 3 nm (at 30 kV, WD 8 mm, SE, HV mode).
- Magnification: 5x - 300 000x.
- Adjustable pressure: 10 - 270 Pa (LV mode).
- Nordlys EBSD Detector (Oxford Instruments).
Responsible body
Group / laboratory / team
Microstructure and mechanics of materials