Centre of Electron Microscopy for Materials Science

The Center of Electron Microscopy for Materials Science (CME) is a unit operating within the Faculty of Metals Engineering and Industrial Computer Science of the AGH University of Science and Technology in Kraków. The Center specializes in advanced electron microscopy techniques, including scanning and transmission. The CME is equipped with modern equipment, enabling precise structural observations at the nanometer level. It operates in the field of scientific research, supporting both scientific and industrial projects. Thanks to access to advanced equipment, the Electron Microscopy Center is an essential link in developing knowledge in the technical and biomedical sciences field. The research topics carried out within the group are related to the use of advanced microscopic methods and techniques (LM, SEM and TEM) in microstructural research of structural materials and mainly include issues such as: 1. Quantitative characterization of the microstructure of materials using analytical electron microscopy methods, also on the atomic scale: - Microstructure analysis and measurement of microstructure parameters using various imaging and diffraction methods. - Microstructure analysis with atomic-scale resolution using STEM-HAADF images with spherical aberration correction. 2. Orientation maps and phase maps in nano areas: - Diffraction analysis: Selective electron diffraction (SAED); Convergent beam diffraction (CBED); Micro- and nano diffraction (μD, NBD). Precession electron diffraction (PED). - Identification of phases in multiphase and multilayer materials using diffraction and spectroscopic methods supported by computer programs. - High-resolution electron microscopy (HRTEM). 3. Analysis of the chemical composition of phases (qualitative and quantitative) using spectroscopic methods: - Energy of characteristic X-rays (EDX) with the ability to collect maps of the distribution of elements on the atomic scale. - Electron energy loss spectrometry (EELS). - Element distribution maps using an electron energy filter (EFTEM). 4. Analysis of the electronic structure in nano areas using EELS spectral imaging: - Maps of binding and oxidation states. - Maps of plasmon resonance peaks (both surface and volume). 5. Phase transformations and interfacial interactions in nanomaterials: - The influence of dimension on the thermodynamic properties of nanomaterials - Kinetics of phase transformations in eutectic pairs - Phase diagrams of binary alloy nanoparticles - Diffusion processes in nanometric systems - Metal-induced crystallization kinetics of amorphous layers. - Morphology of multi-component nanoparticles. - Metastable phases in nanomaterials: formation and temperature stability. - Wettability in nanometric systems. 6. Electron tomography (HAADF, EFTEM, EDX) and FIB-SEM tomography are used to reconstruct three-dimensional images of the micro- and nanostructure of materials and metrology. - Application of machine learning and artificial intelligence in tomography and electron microscopy.

Transmisyjny mikroskop elektronowy (TEM) Tecnai TF 20 X-TWIN (FEI)

Sample preparation laboratory, A2 pok. 17H

Transmission and scanning microscopy laboratory, A2 pok.9

FIB-SEM Laboratory, A2 pok. 13B

Towards the development of novel functional nanomaterials: Establishing processing-structure-property relationships in single nanoparticles of binary alloys (UMO-2021/43/B/ST5/00320)

Interfacial kinetics in nanosized metal-semiconductor films: an in situ HRTEM study (UMO-2016/23/B/ST8/00537)

Enabling Science and Technology through European Electron Microscopy (823717)

The Center for Electron Microscopy for Materials Engineering (CEM) cooperates with 46 research centers from 18 countries. The main trend is cooperation under bilateral agreements and cooperation within projects implemented under the 6th and 7th Framework Program of the European Union and Horizon 2020 as well as the Knowledge and Innovation Community (EIT KIC).