Metallographical microscope Nikon Eclipse LV150N

Trade name
NIKON ECLIPSE LV150N
Technical description

The light microscope (LM) allows imaging in reflected light in bright field (BF), dark field (DF), polarised light (POL) and reflected light. field (BF). It has a fully motorized stage (X,Y,Z), allowing automatic taking pictures in extended depth of field (EDF), along with three-dimensional surface imaging, and also allows the automatic scanning of whole metallographic specimens in high resolution.

Conditions for providing infrastructure

Equipment is available in accordance with the Regulations for the Use of ACMiN's Research Infrastructure. (https://acmin.agh.edu.pl/acmin/dokumenty/)

Type of accreditation / certificate:
Not applicable
Access type
External
Research capabilities

The light microscope (LM) allows imaging in reflected light in bright field (BF), dark field (DF), polarised light (POL) and reflected light. field (BF). It has a fully motorized stage (X,Y,Z), allowing automatic taking pictures in extended depth of field (EDF), along with three-dimensional surface imaging, and also allows the automatic scanning of whole metallographic specimens in high resolution.

Last update date
Jan. 9, 2024, 10:37 a.m.
Year of commissioning
2023
Photos
Microscope
Microscope