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Scanning electrochemical microscope - BioLogic M470

Technical description: Electrochemical scanning station enabling imaging of the sample surface using techniques such as:  - LEIS - the technique enables LEIS and local electrochemical impedance microscopy (LEIM) measurements. In LEIS impedance spectra are measured…

High-resolution electron beam lithography system

Contact person: Chrobak Maciej
Technical description: The Class 100 clean room houses the electron lithography unit (Raith eLine+). The system consists of an electron gun, a secondary electron detector, an in-lens detector, a laser interferometer, control electronics, and a pump system to maintain adeq…

Ion etching and layer deposition system

Contact person: Chrobak Maciej
Technical description: The Class 1000 clean room houses the Microsystems IonSys 500 ion etching and thin film deposition device. The system is equipped with an ion gun along with a SIMS detector, which enables the etching of thin films with nanometer precision, and a magn…

VSM magnetometer with cryostat

Contact person: Żywczak Antoni
Technical description: Vibrating sample magnetometer, LakeShore 7407 VSM, is equipped with continuous flow cryostat and owen. It is capable to probe DC magnetization as a function of temperature and external magnetic field. Temperature dependent measurements can be perfor…

Integrated System for Low-Intensity Signal Detection

Contact person: Chrobak Maciej
Technical description: The Keithley 4200A-SCS is a complete semiconductor parameter analyzer equipped with four SMU measurement modules (4201-SMU) and one 4215-CVU capacitance–voltage module, enabling a full range of I-V, C-V, C-f, C-t, and AC impedance measurements…

Magnetron sputtering system Leica EM ACE600

Contact person: Sławek Andrzej
Technical description: High vacuum magnetron sputtering system Lecia EM ACE600 for deposition of thin films from two independent metal target sources. The sputtering system contains: inner, integrated oil-free diaphragm pump and turbomolecular pump, two independen…

Two-channel system for measuring the temperature dependence of carrier mobility

Contact person: Szaciłowski Konrad
Technical description: A two-channel system for measuring the temperature dependence of carrier mobility enables basic electrochemical measurements in the temperature range from -40°C to 150°C. The system has two channels equipped with EIS modules, enabling electr…

Advanced BET microporous and surface analysis system for ultraporous materials – metal-organic frameworks (MOFs) and aerogels

Contact person: Wuttke Stefan
Technical description: Autosorb 6100 (FKM seals, 2 measurement stations, 6 degas stations, MP–MP transducer set) — a compact high-vacuum gas sorption analyzer for precise BET surface area, pore volume and pore size distribution measurements from ultralow relat…

Digital optical microscope

Technical description: The HRX-01-IR microscope system is designed for in-situ observation of liquids and solids in the visible, infrared, and ultraviolet spectral ranges. It enables 2D and 3D measurements both in the horizontal plane and vertical axis. The workstation co…

Single crystal growing furnaces (Bridgman method)

Contact person: Tokarski Tomasz
Technical description: Single crystals growing devices using Bridgman technique. Resistance heaters are capable of achieving temperatures up to 1100°C allowing for controlled crystallisation of the pure metals and alloys within specified temperature range. Going from …