Equipment
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
Transmission Electron Microscope
Contact person:
Moskalewicz Tomasz
Technical description:
The transmission electron microscope is equipped with:
cold field emission gun, accelerating voltage: 60 kV and 200 kV,
spherical aberration (Cs) corrector,
high angle annular dark field detector (HAADF),
selected area all field de…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
EBSD and EDS detectors
Contact person:
Cios Grzegorz
Technical description:
The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…
Scanning Electron Microscope setup
Contact person:
Ziąbka Magdalena
Technical description:
SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…