Equipment
Transmission Electron Microscope
Contact person:
Moskalewicz Tomasz
Technical description:
The transmission electron microscope is equipped with:
cold field emission gun, accelerating voltage: 60 kV and 200 kV,
spherical aberration (Cs) corrector,
high angle annular dark field detector (HAADF),
selected area all field de…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
Thin foil electropolisher TenuPol
Contact person:
Cios Grzegorz
Technical description:
The TenuPol-5 is designed for automatic electrolytic thinning of specimens for examination in a transmission electron microscope. Establishing parameters for new materials and storing them in the method database is simple, using the built-in scannin…
High-resolution transmission electron microscope
Contact person:
Kruk Adam
Technical description:
High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…
