Transmission electron microscope
FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the acceleration voltage range from 20 kV to 200 kV. The Tecnai G2 analytical electron microscope is equipped with the STEM - HAADF detector, the EDX TIA microanalysis system, the DigiStar electron diffraction precession system and the ASTAR system for automatic analysis of grain orientation and phase maps in nanoareas (NanoMEGAS).
On terms agreed with the Head of the Laboratory - dr hab. Eng. Adam Kruk, prof. AGH
TEM, BF-TEM, STEM, HAADF-STEM, STEM-EDX, analysis of grain orientation and phase maps in nanoareas.
Chemical composition studies, phase analysis of precipitates, analysis of grain orientation and phase maps in nanoareas at the nanoscale.
Responsible body