Filters

Export results

Equipment


Arc melter

Contact person: Kozieł Tomasz
Technical description: Laboratory furnace for synthesizing metallic materials, including reactive and high-melting ones, through arc melting in a protective atmosphere. The device enables the production of laboratory casts weighing up to 200 g, solidifying on a copper wat…

DC magnetron vacuum sputtering system

Contact person: Kryshtal Oleksandr
Technical description: Simple and functional sputter deposition unit for reproducible thin film layers applying. Optimized for co-deposition of TEM specimens. Main parameters: - Base pressure range 10-7 mbar - Process chamber diameter: Ø 355 mm - Substrate stage fo…

Multifunctional robot for the 500T hydraulic press

Contact person: Lisiecki Łukasz
Technical description: 1. Industrial robot – Kawasaki RS030N • maximum load capacity: 30 kg • number of axes: 6 • maximum reach: 2100 mm • robot weight (arm): 555 kg • repeatability: ≤ ±0.03mm, (±0.06mm with the surface of t…

Skaner 3D - Gom2

Contact person: Perzyński Konrad
Technical description: The GOM Scan 1 non-contact scanner is an advanced device based on GOM's blue light technology and rod projection used in reverse engineering for digitizing analyzed products and objects. GOM Scan 1 is equipped with advanced Blue Light technology…

Transmission electron microscope

Contact person: Kruk Adam
Technical description: FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the ac…

Scanning electron microscope, SEM

Contact person: Kruk Adam
Technical description: MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …

High-resolution transmission electron microscope

Contact person: Kruk Adam
Technical description: High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…

Frezarka CNC EBERLE FRP 600

Contact person: Błoniarz Remigiusz
Technical description: CNC milling machine in gantry configuration, equipped with a tool magazine with a capacity of 8 tools. The 3-axis machine allows the movement of each axis: X=320 mm, Y=250 mm, Z=250 mm. The clamping surface of the table is 500x250 mm. The rotational…

thermobalance, calorimeter

Contact person: Kargul Tomasz
Technical description: The device is equipped with a scale with a resolution of 0.1 µg and an air-cooled furnace with rhodium heating elements, allowing for testing in the temperature range from RT to 1550°C, in an inert or oxidizing atmosphere. The furnace'…

FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun

Contact person: Kruk Adam
Technical description: FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…