Equipment
Laser system
Contact person:
Kąc Sławomir
Technical description:
The laser system (laser machine) is used for surface heat treatment, welding, cutting materials and coatings deposition (cladding) with additional material in the form of powders. It is used both for research purposes, e.g.: implementation of scient…
Microbalance
Contact person:
Rutkowski Bogdan
Technical description:
Microbalance MYA 5.4Y.B manufactured by Radwag.
Measurement range: 5,1 g.
Arc melter
Contact person:
Kozieł Tomasz
Technical description:
Laboratory furnace for synthesizing metallic materials, including reactive and high-melting ones, through arc melting in a protective atmosphere. The device enables the production of laboratory casts weighing up to 200 g, solidifying on a copper wat…
DC magnetron vacuum sputtering system
Contact person:
Kryshtal Oleksandr
Technical description:
Simple and functional sputter deposition unit for reproducible thin film layers applying. Optimized for co-deposition of TEM specimens. Main parameters: - Base pressure range 10-7 mbar - Process chamber diameter: Ø 355 mm - Substrate stage fo…
Multifunctional robot for the 500T hydraulic press
Contact person:
Lisiecki Łukasz
Technical description:
1. Industrial robot – Kawasaki RS030N • maximum load capacity: 30 kg • number of axes: 6 • maximum reach: 2100 mm • robot weight (arm): 555 kg • repeatability: ≤ ±0.03mm, (±0.06mm with the surface of t…
Skaner 3D - Gom2
Contact person:
Perzyński Konrad
Technical description:
The GOM Scan 1 non-contact scanner is an advanced device based on GOM's blue light technology and rod projection used in reverse engineering for digitizing analyzed products and objects. GOM Scan 1 is equipped with advanced Blue Light technology…
Transmission electron microscope
Contact person:
Kruk Adam
Technical description:
FEI Tecnai G2 20 TWIN is a transmission electron microscope that is an auxiliary device for initial analysis, quality of samples and preliminary structural tests. It is equipped with an electron gun with a LaB6 cathode and allows operation in the ac…
Scanning electron microscope, SEM
Contact person:
Kruk Adam
Technical description:
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …
High-resolution transmission electron microscope
Contact person:
Kruk Adam
Technical description:
High-resolution analytical transmission electron microscope (resolution equal to 70 pm) with unique instrumentation. It is equipped with an X-FEG electron gun, a monochromator, a corrector for spherical aberration of the condenser system and the lat…
Frezarka CNC EBERLE FRP 600
Contact person:
Błoniarz Remigiusz
Technical description:
CNC milling machine in gantry configuration, equipped with a tool magazine with a capacity of 8 tools. The 3-axis machine allows the movement of each axis: X=320 mm, Y=250 mm, Z=250 mm. The clamping surface of the table is 500x250 mm. The rotational…
