Transmission Electron Microscope
The transmission electron microscope is equipped with:
- cold field emission gun, accelerating voltage: 60 kV and 200 kV,
- spherical aberration (Cs) corrector,
- high angle annular dark field detector (HAADF),
- selected area all field detector (SAAF), dedicated to annular bright field (ABF), optimum bright field (OBF) and differential phase-contrast (DPC) methods
- energy dispersive X-ray spectrometer (EDS) - Dual Silicon Drift Detector JEOL Centurio XXXL,
- 4D-STEM Gatan 4D STEMx system with the ability to acquire and analyze data in the 4D-STEM technique and perform studies such as deformation maps, crystallographic orientation maps, creation of virtual apertures and differential phase contrast,
- Gatan METRO camera for direct electron detection,
- double tilt liquid nitrogen cryo-transfer holder model 915 of Gatan for observations and EDS analyses at cryogenic temperatures,
Poseidon Select in-situ TEM liquid cell holder, for observations in a liquid environment/liquid state and examining chemical, electrochemical and structural processes occurring in real-time and on the nanoscale.
To be agreed with the contact person.
The microscope is designed to work in TEM, STEM and 4D-STEM modes. The microscope is dedicated to high-resolution chemical observations and analyses on the micro-, nano- and atomic scales, as well as in-situ environmental research in liquids and at cryogenic temperatures. The magnification range of microscopic images in TEM is from 50x to 1500000x.
Not applicable
Responsible body
Group / laboratory / team
Interdepartmental Transmission Electron Microscopy Laboratory