Equipment
Acoustic Emission acquisition system
Contact person:
Paćko Paweł
Technical description:
The acoustic emission measurement system is an advanced, multichannel setup designed for recording the full wavefield generated during processes occurring in materials and structural components. Its central element is an acquisition unit equipped wi…
Scanning electrochemical microscope - BioLogic M470
Contact person:
Jarczewski Sebastian
Technical description:
Electrochemical scanning station enabling imaging of the sample surface using techniques such as:
- LEIS - the technique enables LEIS and local electrochemical impedance microscopy (LEIM) measurements. In LEIS impedance spectra are measured…
High-resolution electron beam lithography system
Contact person:
Chrobak Maciej
Technical description:
The Class 100 clean room houses the electron lithography unit (Raith eLine+). The system consists of an electron gun, a secondary electron detector, an in-lens detector, a laser interferometer, control electronics, and a pump system to maintain adeq…
Ion etching and layer deposition system
Contact person:
Chrobak Maciej
Technical description:
The Class 1000 clean room houses the Microsystems IonSys 500 ion etching and thin film deposition device. The system is equipped with an ion gun along with a SIMS detector, which enables the etching of thin films with nanometer precision, and a magn…
VSM magnetometer with cryostat
Contact person:
Żywczak Antoni
Technical description:
Vibrating sample magnetometer, LakeShore 7407 VSM, is equipped with continuous flow cryostat and owen. It is capable to probe DC magnetization as a function of temperature and external magnetic field. Temperature dependent measurements can be perfor…
Integrated System for Low-Intensity Signal Detection
Contact person:
Chrobak Maciej
Technical description:
The Keithley 4200A-SCS is a complete semiconductor parameter analyzer equipped with four SMU measurement modules (4201-SMU) and one 4215-CVU capacitance–voltage module, enabling a full range of I-V, C-V, C-f, C-t, and AC impedance measurements…
Autoclave system
Contact person:
Frączek-Szczypta Aneta
Technical description:
The HVA-70/100-10.0 autoclave system (AMP company) is an advanced device dedicated to manufacturing high-quality polymer- and carbon-matrix composite structures. The system enables curing processes under controlled elevated temperatur…
High-temperature microscope with an optical dilatometer for testing ceramic and other materials, operating at temperatures up to 1700°C
Contact person:
Madej Dominika
Technical description:
A high-temperature microscope with an optical dilatometer is designed for advanced observation of materials at elevated temperatures, as well as for determining the coefficient of thermal expansion using a non-contact method up to 1700°C.
The…
SPS (Spark Plasma Sintering) powder consolidation system – GeniCore U‑FAST COMPACT
Contact person:
Pędzich Zbigniew
Technical description:
U‑FAST COMPACT is a laboratory SPS system designed for rapid powder sintering using pulsed direct current. It features a vacuum chamber, hydraulic system, high‑current pulsed power supply, water cooling, and temperature and shrinkage measurement. Th…
Oxygen/Nitrogen/Hydrogen Elemental Analyzer
Entity:
Department of Fuel Technology
Contact person:
Czosnek Cezary
Technical description:
The ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer is designed for wide-range measurement of oxygen, nitrogen, and hydrogen content of inorganic materials, ferrous and nonferrous alloys, and refractory materials using the inert gas fusion techni…
