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Argon ion milling system for samples flat milling or cross-section preparation

Contact person: Tokarski Tomasz
Technical description: The ion polisher is a device used for precision polishing of flat surfaces as well as for cross-sectioning metallic, ceramic and polymer materials. The device is capable to work with samples up to 50 mm in diameter at ion energies up to 6 keV. It is…

EBSD and EDS detectors

Contact person: Cios Grzegorz
Technical description: The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…

Scanning electron microscope FEI Quanta 200 FEG

Contact person: Bajda Tomasz
Technical description:  High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter),  magnification 70 ÷ 300,000x Technical parameters: Accelerating voltage 5 - 30 kV Variable vacuum syst…

DualBeam Focused Ion Beam/Scanning Electron Microscop (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …

Scanning Electron Microscope setup

Contact person: Ziąbka Magdalena
Technical description: SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…