Equipment
Scanning Electron Microsocpe JEOL JSM-6490LA
Contact person:
Wroński Sebastian
Technical description:
The JEOL JSM-6490LA scanning electron microscope with a LaB6 electron gun and an ion pumping system. The microscope is equipped with both backscattered electron (BSE) and secondary electron (SE) detectors, as well as an EBSD (Electron Back Scattered…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
EBSD and EDS detectors
Contact person:
Cios Grzegorz
Technical description:
The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…
Scanning electron microscope equipped with ion gun (SEM/FIB)
Contact person:
Gajewska Marta
Technical description:
The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…
Scanning electron microscope FEI Quanta 200 FEG
Contact person:
Bajda Tomasz
Technical description:
High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter), magnification 70 ÷ 300,000x
Technical parameters:
Accelerating voltage 5 - 30 kV
Variable vacuum syst…
Scanning Electron Microscope setup
Contact person:
Ziąbka Magdalena
Technical description:
SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…
FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun
Contact person:
Kruk Adam
Technical description:
FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…
