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DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)

Contact person: Berent Katarzyna
Technical description: Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …

DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …

EBSD and EDS detectors

Contact person: Cios Grzegorz
Technical description: The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…

Scanning electron microscope equipped with ion gun (SEM/FIB)

Contact person: Gajewska Marta
Technical description: The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…

Scanning electron microscope FEI Quanta 200 FEG

Contact person: Bajda Tomasz
Technical description:  High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter),  magnification 70 ÷ 300,000x Technical parameters: Accelerating voltage 5 - 30 kV Variable vacuum syst…

Scanning Electron Microscope setup

Contact person: Ziąbka Magdalena
Technical description: SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…

FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun

Contact person: Kruk Adam
Technical description: FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…