Equipment
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
EBSD and EDS detectors
Contact person:
Cios Grzegorz
Technical description:
The Symmetry S2 EBSD detector is mounted on a Versa 3D scanning electron microscope (SEM) in the ACMIN scanning electron microscopy laboratory. It allows for: -analysis of the local texture and phase composition of crystalline materials. -with a rat…
Scanning electron microscope equipped with ion gun (SEM/FIB)
Contact person:
Gajewska Marta
Technical description:
The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…
Scanning electron microscope FEI Quanta 200 FEG
Contact person:
Bajda Tomasz
Technical description:
High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter), magnification 70 ÷ 300,000x
Technical parameters:
Accelerating voltage 5 - 30 kV
Variable vacuum syst…
Scanning Electron Microscope setup
Contact person:
Ziąbka Magdalena
Technical description:
SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…
FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun
Contact person:
Kruk Adam
Technical description:
FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini opt…
