Equipment

Technical description: The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U. Specification: Analyzed elements range: Be – U (Z = 4 &ndas…

Technical description: The ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer is designed for wide-range measurement of oxygen, nitrogen, and hydrogen content of inorganic materials, ferrous and nonferrous alloys, and refractory materials using the inert gas fusion techni…

Technical description: Elemental analyzer to work in configurations CHN, CHNS CHNSO. Modular design for quick reconfiguration and CHNS and O analysis. Two separate reaction furnaces with electronic temperature control, compatible with Combustion Reduction Reactors for C, …

Technical description: The ZSX Primus II RIGAKU X-ray Fluorescence Wave Dispersion Spectrometer (WDXRF) enables qualitative and quantitative analysis of elements in the range from nitrogen (N) to uranium (U) (Z = 7 - 92). Spectrometer characteristics: X-ray tube …

Technical description: Inductively coupled plasma mass spectrometer model iCAP RQ (C2) with collision/reaction chamber (Thermo Scientific). A choice of three inserts allow the user to balance the needs of matrix resistance against absolute sensitivity: "robust&quo…

Technical description: Inductively Coupled Plasma Optical Emission Spectrometer model Optima 7300DV (Perkin Elmer). Plasma can be observed in two directions, in the so-called dual view system (axial and radial). The use of two semiconductor detectors (one for UV, one f…

Technical description: The EA-1108 elemental analyzer is a device for Organic Elemental Analysis (OEA) using the method of dynamic combustion of samples (of organic and inorganic origin) in a reactor filled with an oxidation-reduction catalytic bed with an electronically …