Trade name
Scanning electron microscope FEI Nova NanoSEM 200
Technical description

Ultra-high resolution scanning electron microscope equipped with field emission  electron gun (FEG - Schotky’s  emitter), coupled with EDS by EDAX. Threshold resolution 2 nm, magnification range 70 – 500 000x.

Conditions for providing infrastructure

Operation only by the stuff of Departmental Laboratory of Scanning Electron Microscopy and Microanalysis WIMiC.
Order/contract/other form of collaboration upon arrangement.

Type of accreditation / certificate:
Not applicable
Access type
Research capabilities

High resolution microstructural imaging of various materials. The imaging is possible in high as well as in low vacuum mode.

Surface imaging with secondary (SE) or back scattered (BSE) electrons.

Microstructural analyses of powders and monolithic materials (polished surfaces or newly made ruptured surfaces).

Elemental analyses, starting from boron up to the end of periodic table. Mapping of the elements in a sample as well as the line analysis.

Last update date
May 24, 2023, 2 p.m.
Year of commissioning
Measurement capabilities
  • Electron gun accelerating voltage: 5-20 kV
  • Chamber pressure < 10-2 Pa (HVac) or 60-200 Pa (LVac)
  • High vacuum detectors: Everhart-Thornley SED, BSED, In-lens TLD – utra high resolution detector (non-magnetic samples only)
  • Low vacuum  detectors: low vacuum LVD, helix – ultra high resolution (non-magnetic samples only)
FEI Nova NanoSEM 200
FEI Nova NanoSEM 200