NOVA NanoSEM 200
Ultra-high resolution scanning electron microscope equipped with field emission electron gun (FEG - Schotky’s emitter), coupled with EDS by EDAX. Threshold resolution 2 nm, magnification range 70 – 500 000x.
Operation only by the stuff of Departmental Laboratory of Scanning Electron Microscopy and Microanalysis WIMiC.
Order/contract/other form of collaboration upon arrangement.
High resolution microstructural imaging of various materials. The imaging is possible in high as well as in low vacuum mode.
Surface imaging with secondary (SE) or back scattered (BSE) electrons.
Microstructural analyses of powders and monolithic materials (polished surfaces or newly made ruptured surfaces).
Elemental analyses, starting from boron up to the end of periodic table. Mapping of the elements in a sample as well as the line analysis.
- Electron gun accelerating voltage: 5-20 kV
- Chamber pressure < 10-2 Pa (HVac) or 60-200 Pa (LVac)
- High vacuum detectors: Everhart-Thornley SED, BSED, In-lens TLD – utra high resolution detector (non-magnetic samples only)
- Low vacuum detectors: low vacuum LVD, helix – ultra high resolution (non-magnetic samples only)
Responsible body