Equipment
Thermal conductivity analyzer TRIDENT
Contact person:
Madejski Paweł
Technical description:
The Trident Thermal Conductivity Analyzer is an advanced device used to measure the thermal conductivity of various materials, offering three different thermal conductivity measurement techniques: MTPS (Modified Transient Plane Source), TPS (Transie…
Thermal imaging camera FLIR
Contact person:
Madejski Paweł
Technical description:
The FLIR A70 29° Research & Development Kit is an advanced thermal imaging system designed for research and industrial applications. It enables high-precision, non-contact temperature measurement with 640 × 480 px resolution and therma…
Atomic force microscope combined with nanoindenter
Contact person:
Szuwarzyński Michał
Technical description:
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…
High speed mixer
Contact person:
Berent Katarzyna
Technical description:
The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.
Mixer Mill
Contact person:
Berent Katarzyna
Technical description:
The Mixer Mill MM 400 is a true multipurpose mill designed for dry and wet grinding of small volumes up to 2 x 20 ml. It mixes and homogenizes powders and suspensions with a frequency of 30 Hz within seconds.
Ultrasonic cleaner
Contact person:
Berent Katarzyna
Technical description:
The device is used for effective and precise cleaning of a variety of objects. The cleaner can adjust the amplitude of vibration and temperature and has a timer programmer.
Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS
Contact person:
Kmita Angelika
Technical description:
Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.
ScatterX78
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
