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High speed mixer

Contact person: Berent Katarzyna
Technical description: The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.

Mixer Mill

Contact person: Berent Katarzyna
Technical description: The Mixer Mill MM 400 is a true multipurpose mill designed for dry and wet grinding of small volumes up to 2 x 20 ml. It mixes and homogenizes powders and suspensions with a frequency of 30 Hz within seconds. 

Ultrasonic cleaner

Contact person: Berent Katarzyna
Technical description: The device is used for effective and precise cleaning of a variety of objects. The cleaner can adjust the amplitude of vibration and temperature and has a timer programmer.

Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS

Contact person: Kmita Angelika
Technical description: Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.

ScatterX78

Technical description: The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…

X-RAY Diffractometer with SAXS/WAXS

Technical description: Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…

DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …

Turbomolecular pumped coater Q150T E Quorum Technologies

Contact person: Berent Katarzyna
Technical description: The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…

Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)

Contact person: Gajewska Marta
Technical description: Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…

Scanning electron microscope equipped with ion gun (SEM/FIB)

Contact person: Gajewska Marta
Technical description: The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…