Equipment
High speed mixer
Contact person:
Berent Katarzyna
Technical description:
The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.
Mixer Mill
Contact person:
Berent Katarzyna
Technical description:
The Mixer Mill MM 400 is a true multipurpose mill designed for dry and wet grinding of small volumes up to 2 x 20 ml. It mixes and homogenizes powders and suspensions with a frequency of 30 Hz within seconds.
Ultrasonic cleaner
Contact person:
Berent Katarzyna
Technical description:
The device is used for effective and precise cleaning of a variety of objects. The cleaner can adjust the amplitude of vibration and temperature and has a timer programmer.
Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS
Contact person:
Kmita Angelika
Technical description:
Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.
ScatterX78
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting resear…
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)
Contact person:
Gajewska Marta
Technical description:
Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…
Scanning electron microscope equipped with ion gun (SEM/FIB)
Contact person:
Gajewska Marta
Technical description:
The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…
