Equipment
VSM magnetometer with cryostat
Contact person:
Szkudlarek Aleksandra
Technical description:
Vibrating sample magnetometer, LakeShore 7407 VSM, is equipped with continuous flow cryostat and owen. It is capable to probe DC magnetization as a function of temperature and external magnetic field. Temperature dependent measurements can be perfor…
Atomic force microscope combined with nanoindenter
Contact person:
Szuwarzyński Michał
Technical description:
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…
Spectroscopic ellipsometer
Contact person:
Mazur Tomasz
Technical description:
The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …
Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) Rigaku ZSX Primus IV
Contact person:
Mech Krzysztof
Technical description:
The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U.
Specification:
Analyzed elements range: Be – U (Z = 4 &ndas…
Photoelectric spectrometer
Contact person:
Podborska Agnieszka
Technical description:
The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …
Keithley 4200-SCS Semiconductor Characterization System
Contact person:
Mazur Tomasz
Technical description:
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …
FTIR spectrometer for measuring infrared spectra
Contact person:
Podborska Agnieszka
Technical description:
The Bruker Tensor II FTIR spectrometer is equipped with:
attachment for measurements of Attenuated Total Reflectance (ATR) with a monolithic diamond crystal enabling measurement in the range of 350-8000 cm-1, adapted to the measurement of…
Ambient Kelvin Probe
Contact person:
Szaciłowski Konrad
Technical description:
The ambient Kelvin probe is used to measure the work function of conductive materials.
Dual-beam laser - photoelectric spectrometer
Contact person:
Podborska Agnieszka
Technical description:
Light source: two Opolette 355 lasers with an Nd:YAG pump equipped with optical parametric oscillators (OPO) tunable in the range of 210-2400 nm with a peak pulse power of 500 kW.
Detection system: Zahner-Elektric IM6 electrochemical workstation …
LED control system
Contact person:
Podborska Agnieszka
Technical description:
The LED controller is a device that controls LEDs with a power of up to 100 mW. The set of diodes includes LEDs with light wavelengths: 365, 385, 405, 460, 510, 530, 620, 660, 735, 860, 940 nm, as well as white light diodes (3000K, 4000K, 10,000K). …
