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Scanning electron microscope equipped with ion gun (SEM/FIB)

Contact person: Gajewska Marta
Technical description: The Quanta 3D 200i dual beam (SEM/FIB) microscope is a device dedicated to the preparation of thin films for TEM/STEM research. The instrument is equipped with two guns: electron (tungsten filament) and ion (Ga+), a system of precise dosing of worki…

DualBeam Focused Ion Beam/Scanning Electron Microscop (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …