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Scanning electron microscope, SEM

Contact person: Kruk Adam
Technical description: MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …

Scanning electron microscope FEI Quanta 200 FEG

Contact person: Bajda Tomasz
Technical description:  High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter),  magnification 70 ÷ 300,000x Technical parameters: Accelerating voltage 5 - 30 kV Variable vacuum syst…

DualBeam Focused Ion Beam/Scanning Electron Microscop (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …