Equipment
Scanning Electron Microsocpe JEOL JSM-6490LA
Contact person:
Wroński Sebastian
Technical description:
The JEOL JSM-6490LA scanning electron microscope with a LaB6 electron gun and an ion pumping system. The microscope is equipped with both backscattered electron (BSE) and secondary electron (SE) detectors, as well as an EBSD (Electron Back Scattered…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Scanning electron microscope, SEM
Contact person:
Kruk Adam
Technical description:
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …
Scanning electron microscope FEI Quanta 200 FEG
Contact person:
Bajda Tomasz
Technical description:
High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter), magnification 70 ÷ 300,000x
Technical parameters:
Accelerating voltage 5 - 30 kV
Variable vacuum syst…
