Equipment
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
Scanning electron microscope, SEM
Contact person:
Kruk Adam
Technical description:
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini …
Scanning electron microscope FEI Quanta 200 FEG
Contact person:
Bajda Tomasz
Technical description:
High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter), magnification 70 ÷ 300,000x
Technical parameters:
Accelerating voltage 5 - 30 kV
Variable vacuum syst…
