FIB-SEM, SEM Scanning Electron Microscope with FIB Ion gun

FIB-SEM Crossbeam 350 with GEMINI column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini optics, such as accelerating voltage or beam current, are continuously adjustable. The parallel detection of secondary electrons (SE) in the axis of the objective lens and energy-selective backscatter (EsB) allows you to easily identify the smallest differences in the chemical composition of materials. Equipped with an advanced FIB focused ion beam system, which enables quick and precise removal of the material layer and cutting samples (lamellae) for TEM. FIB-SEM Crossbeam 350 with FIB-SEM Crossbeam 350 with GEMINI  column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini II optics, such as accelerating voltage or beam current, are continuously adjustable. The parallel detection of secondary electrons (SE) in the axis of the objective lens and energy-selective backscatter (EsB) allows you to easily identify the smallest differences in the chemical composition of materials. Equipped with an advanced FIB focused ion beam system, which enables quick and precise removal of the material layer and cutting samples (lamellae) for TEM. FIB-SEM Crossbeam 350 with GEMINI I column and FEG electron source offers high resolution imaging using advanced detection modes including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB). The imaging settings of the Gemini I optics, such as accelerating voltage or beam current, are continuously adjustable. The parallel detection of secondary electrons (SE) in the axis of the objective lens and energy-selective backscatter (EsB) allows you to easily identify the smallest differences in the chemical composition.