Scanning electron microscope, SEM
MERLIN with GEMINI II column and FEG electron source offers high-resolution imaging with advanced detection modes, including InLens (SE), InLens (EsB), Angle Selective Back-Scattered Detector (AsB), 3DSM and STEM. The imaging settings of the Gemini II optics, such as accelerating voltage or beam current, are continuously adjustable. The parallel detection of secondary electrons (SE) in the axis of the objective lens and energy-selective backscatter (EsB) allows you to easily identify the most minor differences in the chemical composition of materials. The microscope is equipped with an EDX detector with the Quantax 800 microanalysis system (Bruker) and an EBSD detector with the Quantax CrystAlign 400 microanalysis system (Bruker).
On terms agreed with the Head of the Laboratory - dr hab. Eng. Adam Kruk, prof. AGH
InLens (SE), InLens (EsB), Angle Selective back-scattered detector (AsB), 3DSM, STEM, SEM-EDX, SEM-EBSD
Chemical composition studies, high resolution, nanoscale orientation measurements
Responsible body