Atomic force microscope combined with nanoindenter
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscope enables the studies of small and large samples up to a diameter of 200 mm and a thickness of 15 mm, which makes it suitable for imaging both laboratory and industrial samples. Measurements take place in a dedicated insulating and anti-vibration chamber that provides additional sound insulation. AFM is equipped with the Closed-Loop system and allows you to take measurements using the most important AFM techniques.
In addition, the microscope is equipped with a second scanning head - Bruker Hysitron TriboScope, intended for imaging hard samples and simultaneous quantitative measurements of hardness and Young's modulus (nanoindenter scanning with a Berkovivch blade or a flat blade). Nanoindenter is additionally equipped with a dynamic operating mode - nanoDMA.
Equipment is available in accordance with the Regulations for the Use of ACMiN's Research Infrastructure. (https://acmin.agh.edu.pl/acmin/dokumenty/)
- Contact and Tapping Mode
- PeakForce Tapping (inc. QNM quantitative phase imaging)
- Lateral Force Microscopy
- Lift Mode (inc. high-resolution magnetic MFM, electrostatic EFM and KPFM Kelvin probe)
- Force Spectroscopy
- Torsion Resonance Mode
- Piezoresponse Microscopy
- Electrical measurements (C-AFM, high-resolution PF-TUNA, multi-channel Data Cube mode)
- solid samples (modulus up to 200 GPa), alloys, powders, metallic surfaces and composites,
- soft and biological samples both in air and in liquids
- in the temperature range from -35 to 250 °C,
- conductive, magnetic and surface charged samples
- samples in the size of 200 (length) x 200 (width) x 15 (height) mm,
- max. scanner range: 90 × 90 μm in the horizontal range and up to 10 μm in the vertical range.
Responsible body
Group / laboratory / team
Surface and Biomaterials Nanoengineering