Atomic force microscope combined with nanoindenter

Trade name
Combined nanoindenter system with atomic force microscope
Technical description

The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscope enables the studies of small and large samples up to a diameter of 200 mm and a thickness of 15 mm, which makes it suitable for imaging both laboratory and industrial samples. Measurements take place in a dedicated insulating and anti-vibration chamber that provides additional sound insulation. AFM is equipped with the Closed-Loop system and allows you to take measurements using the most important AFM techniques.

In addition, the microscope is equipped with a second scanning head - Bruker Hysitron TriboScope, intended for imaging hard samples and simultaneous quantitative measurements of hardness and Young's modulus (nanoindenter scanning with a Berkovivch blade or a flat blade). Nanoindenter is additionally equipped with a dynamic operating mode - nanoDMA.

Conditions for providing infrastructure

Equipment is available in accordance with the Regulations for the Use of ACMiN's Research Infrastructure. (

Type of accreditation / certificate:
Not applicable
Access type
Research capabilities
  • Contact and Tapping Mode
  • PeakForce Tapping (inc. QNM quantitative phase imaging)
  • Lateral Force Microscopy
  • Lift Mode (inc. high-resolution magnetic MFM, electrostatic EFM and KPFM Kelvin probe)
  • Force Spectroscopy
  • Torsion Resonance Mode
  • Piezoresponse Microscopy
  • Electrical measurements (C-AFM, high-resolution PF-TUNA, multi-channel Data Cube mode)
Last update date
May 25, 2023, 11:26 a.m.
Year of commissioning
Measurement capabilities
  • solid samples (modulus up to 200 GPa), alloys, powders, metallic surfaces and composites,
  • soft and biological samples both in air and in liquids
  • in the temperature range from -35 to 250 °C,
  • conductive, magnetic and surface charged samples
  • samples in the size of 200 (length) x 200 (width) x 15 (height) mm,
  • max. scanner range: 90 × 90 μm in the horizontal range and up to 10 μm in the vertical range. 
Atomic force microscope combined with nanoindenter
Atomic force microscope combined with nanoindenter