Equipment
Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS
Contact person:
Kmita Angelika
Technical description:
Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.
X-RAY Diffractometer with SAXS/WAXS
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…
X-RAY Diffractometer with HT chamber
Contact person:
Marciszko-Wiąckowska Marianna
Technical description:
Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
High speed mixer
Contact person:
Berent Katarzyna
Technical description:
The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.
Atomic force microscope combined with nanoindenter
Contact person:
Szuwarzyński Michał
Technical description:
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…
X-ray Photoelectron Spectroscopy
Contact person:
Marzec Mateusz
Technical description:
The spectrometer of photoelectrons emitted under the influence of irradiation with X-ray (XPS) or ultraviolet (UPS) radiation is used to analyze the composition and chemical states of elements on the surface of the tested material. The laboratory is…
HPR-20 R&D quadrupole mass spectrometer (MS)
Contact person:
Kmita Angelika
Technical description:
HPR-20 R&D (MS) quadrupole mass spectrometer coupled with TA Instruments (TG) Q600 thermogravimeter. The TG/DSC-MS system enables qualitative and quantitative analysis of released gases and vapors emitted during sample heating (in the temperatur…
