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Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS

Contact person: Kmita Angelika
Technical description: Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.

X-RAY Diffractometer with SAXS/WAXS

Technical description: Panalytical Empyrean powder diffractometers with Cu lamp. It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). Diffractometer equip…

X-RAY Diffractometer with HT chamber

Technical description: Panalytical Empyrean Powder Diffractometer with Co Lamp It allows to carry out measurements in the geometry of the Bragg-Brentano beam with the use of collimating slits and in the geometry of the parallel beam (Goebel mirror). They are equipped with…

DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)

Contact person: Berent Katarzyna
Technical description: FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …

DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)

Contact person: Berent Katarzyna
Technical description: Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …

Turbomolecular pumped coater Q150T E Quorum Technologies

Contact person: Berent Katarzyna
Technical description: The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…

High speed mixer

Contact person: Berent Katarzyna
Technical description: The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.

Atomic force microscope combined with nanoindenter

Technical description: The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…

X-ray Photoelectron Spectroscopy

Contact person: Marzec Mateusz
Technical description: The spectrometer of photoelectrons emitted under the influence of irradiation with X-ray (XPS) or ultraviolet (UPS) radiation is used to analyze the composition and chemical states of elements on the surface of the tested material. The laboratory is…

HPR-20 R&D quadrupole mass spectrometer (MS)

Contact person: Kmita Angelika
Technical description: HPR-20 R&D (MS) quadrupole mass spectrometer coupled with TA Instruments (TG) Q600 thermogravimeter. The TG/DSC-MS system enables qualitative and quantitative analysis of released gases and vapors emitted during sample heating (in the temperatur…