Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)

Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramics, semiconductors, polymers, composites) in bright field/dark field imaging modes. Observations of this type can be used to determine e.g. size, morphology and microstructure of particles/crystallites in the material, material defects, distribution and size-distribution of precipitates, thickness of coatings/layers. The high resolution of the microscope (point resolution ≤ 0.22 nm, information limit ≤ 0.14 nm) enables detailed imaging of nanostructures (nanoparticles, nanowires, nanolayers, quantum dots, etc.), as well as imaging of the atomic structure of materials (high resolution imaging). In addition, by means of electron diffraction (selected area diffraction) it is possible to: locally identify phases in specific micro-areas in the material, analyze the local orientation of micro-areas, or determine the crystallographic relationships between individual phases in the material. The microscope is also equipped with an integrated X-ray spectrometer (EDAX) used to analyze chemical composition of samples in micro-/nano- areas. Moreover, the microscope has the ability to work in the scanning-transmission mode (STEM) with the HAADF imaging detector.

The microscope is characterized by the following operating parameters:

- electron source with field emission - FEG

- accelerating voltage - 200 kV

- magnification range - 1025 - 900 k

- 2k CCD camera (Eagle 2k HR)

- detectors: EDAX RTEM 0.3 sr, HAADF