Trade name
ScatterX78 chamber - Retrofitting the X-ray diffractometer with a compact SAXS / WAXS chamber
Technical description

The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting research using the diffraction method at a constant angle of incidence of radiation (GIXD). The attachment allows the non-destructive analysis of material properties, geometry and arrangement of objects (amorphous, crystalline) in the nanoscale in the form of liquids, gels, powders, solids (including porous), or multilayer systems with a thickness of the order of nm. What's more, it can be used to determine the details of the crystalline structure of polymers, identify polymorphs, and track the transition from one crystallographic type to another caused by various factors. The systems analyzed with the SAXS / WAXS methods include, among others nanoparticles, nanoparticles, nanoparticle solutions (semiconductor, magnetic, etc.), plastic hybrid systems with nanoparticles.

Conditions for providing infrastructure

Apparatus made available on the terms resulting from the Regulations for the Use of ACMiN Research Infrastructure.

Type of accreditation / certificate:
Not applicable
Access type
Research capabilities


Last update date
Nov. 15, 2023, 9:23 a.m.
Year of commissioning