ScatterX78

The ScatterX78 chamber allows simultaneous measurement in a SAXS and WAXS vacuum. Measurement is possible for object sizes from 1 nm in 1D and 2D dimensions. Additionally, the proposed extension of the research equipment allows for conducting research using the diffraction method at a constant angle of incidence of radiation (GIXD). The attachment allows the non-destructive analysis of material properties, geometry and arrangement of objects (amorphous, crystalline) in the nanoscale in the form of liquids, gels, powders, solids (including porous), or multilayer systems with a thickness of the order of nm. What's more, it can be used to determine the details of the crystalline structure of polymers, identify polymorphs, and track the transition from one crystallographic type to another caused by various factors. The systems analyzed with the SAXS / WAXS methods include, among others nanoparticles, nanoparticles, nanoparticle solutions (semiconductor, magnetic, etc.), plastic hybrid systems with nanoparticles.