Scanning electron microscopy INSPECT S50
Source Tungsten hairpin filament, which is mounted within tetrode gun assembly Voltage 200 V to 30 kV Beam Current Up to 2 μA Resolution (measured as particle separation on a carbon substrate) High-vacuum mode: - 3.0 nm at 30 kV (SED) - 10.0 nm at 3 kV (SED) Low-vacuum mode: - 3.0 nm at 30 kV (SED) - 10.0 nm at 3 kV (SED)
Under contracts and commissioned research tasks/authorization of the head of the IPiAM Department
Research on the structure of materials and nanomaterials, Testing the morphology and chemical composition of non-conductive samples in low and variable vacuum, Orientation topography analysis of fine-crystalline materials with full phase identification, Point, line and surface analyzes of elements using EDXS and WDXS spectrometers, Analysis of crystallographic orientations using backscattered electron diffraction EBSD
Responsible body
Group / laboratory / team
Scanning electron microscopy laboratory/KIPiAM https://kipiam.agh.edu.pl/