Equipment

DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)

Entity: Academic Centre for Materials and Nanotechnology

Technical description: Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …

Keywords: 3D reconstruction ebsd ECCI EDS EDX Electron tomography PFIB SEM STEM

Scanning Electron Microscope setup

Entity: Department of Ceramics and Refractories

Contact person: Ziąbka Magdalena

Technical description: SEM microscopes with electron (FEG) and ionic columns (Gallium – Scios 2). The SEMs include EDS spectroscopes (EDAX), catodoluminescence (GATAN AMETEK) and time of flight secondary ions mass spectroscope, TOF-SIMS. The microscopes are equipped…

Keywords: CL ebsd ECCI EDS ion beam microstructure morphology SEM STEM TOF-SIMS