Profilometer for measuring nanometer-sized layers

Trade name
Bruker DektakXT profilometer
Technical description

Contact needle profilometer for testing surface roughness and waviness with a resolution of 1 A and a repeatability of 4 A≤ (angstrom).

Conditions for providing infrastructure

Equipment is available in accordance with the Regulations for the Use of ACMiN's Research Infrastructure. (https://acmin.agh.edu.pl/acmin/dokumenty/)

Type of accreditation / certificate:
Not applicable
Access type
External
Research capabilities

The apparatus allows measuring the thickness of thin layers deposited by the user, creating profiles in specific directions, and exporting the values, along with roughness conversion.

Last update date
Nov. 10, 2023, 12:39 p.m.
Year of commissioning
2013
Photos
Bruker DektakXT Profilometer
Bruker DektakXT Profilometer