Thermal imaging camera FLIR
The FLIR A70 29° Research & Development Kit is an advanced thermal imaging system designed for research and industrial applications. It enables high-precision, non-contact temperature measurement with 640 × 480 px resolution and thermal sensitivity below 40 mK. Integrated with FLIR Research Studio software, the camera provides real-time thermal data acquisition, visualization, and analysis, making it ideal for material studies, energy systems, electronics testing, and environmental research.
The device is located in the laboratory of the Department of KSEiUOS. The staff appointed by the equipment coordinator (with appropriate qualifications and experience in performing measurements) provides ongoing maintenance of the equipment, as well as training and consultations for new users.
- Thermal analysis of electronic components (e.g., PCBs, integrated circuits) in the prototyping phase.
- Research on heat flows, hot spots, and energy losses in structures/materials.
- Temperature monitoring in industrial systems or during environmental testing, where precision and the ability to document measurements are important.
- Microbolometer detector. 12 µm pixel.
- Resolution: 640×480 pixels.
- Thermal sensitivity (NETD): <35mK.
- Frequency: 30Hz.
- Field of view: 29° × 22°. Manual focus.
- IFOV: 0.84 mrad. Minimum focus distance: 0.25 m.
- Measuring range: 20 to 175°C; 175 to 1000°C.
- Accuracy: +/- 2%.
- Built-in digital camera.
Responsible body
Group / laboratory / team
Research Team: Thermal and Flow Processes in Energy (PCPE)