Electron Microprobe Jeol SuperProbe JXA-8230

Trade name
Electron Microprobe Jeol SuperProbe JXA-8230
Technical description

The JEOL SuperProbe 8230 electron microprobe equipped with:

- 5 wavelength X-Ray spectrometers (WDS) equipped with 12 diffracting crystals (LIF, LIFL, LIFH, TAP, TAPH, PETL, PETH, PETJ, LDE1, LDE2, LDE3);

- Energy-dispersive X-ray spectrometer (EDS);

- Reflected light microscope;

- Transmitted light microscope;

- Cathodoluminescence detector;

The laboratory is equipped with a QUORUM Q150TE turbomolecular pumped coater adapted to coal sputtering.

Conditions for providing infrastructure

On the basis of contracts and orders with the consent of the head of laboratory

Type of accreditation / certificate:
Not applicable
Access type
External
Research capabilities

An electron microprobe has broad applications of imaging in the microfield, compositional spot analysis as well as mapping of the distribution of elements in minerals and inorganic synthetic substances. Chemical analysis is conducted in a micro-area, typically with a spot diameter from <1 to 5 µm of a beam focused on a polished sample. An electron microprobe allows to constrain chemical composition of any substance in the solid state.

Last update date
May 27, 2023, 3:21 p.m.
Year of commissioning
2014
Measurement capabilities

Samples used in electron microprobe analysis are embedded in a rounded, polished epoxy mount with a diameter of approximately 25 mm (1 inch) or a microscopic thin section with dimensions of approximately 46 mm × 27 mm. The electron microprobe enables to perform quantitative analyses of major and trace elements (from 4Be to 92U, excluding noble gases) and chemical mapping of the distribution of elements using EDS and WDS techniques supported by the cathodoluminescence technique.

Photos
Electron Microprobe Jeol SuperProbe JXA-8230
Electron Microprobe Jeol SuperProbe JXA-8230
Electron Microprobe Jeol SuperProbe JXA-8230
Electron Microprobe Jeol SuperProbe JXA-8230