Photoelectric spectrometer
The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a measuring electrode in the form of an oscillating golden grid.
Equipment made available on the terms resulting from the Regulations for the Use of ACMiN Research Infrastructure. (https://acmin.agh.edu.pl/home/acmin/5_Wspolpraca/Aparatura/Zasady_i_koszty_korzystania_z_infrastruktury_badawczej_ACMiN.pdf)
The device is used to test semiconductor materials and allows for:
- measurement of photocurrent action spectra in a wide range of excitation light wavelengths and working electrode potential,
- measurement of the work function of the output as a function of the wavelength of the incident light,
- determination of three-dimensional maps of photocurrents generated by the semiconductor
- determining the type of conductivity.
Work parameters:
- wavelength range: 200-1000 nm
- working electrode polarization range: ±2 V
- photovoltage detector sensitivity <1 mV
- accuracy of setting the measuring electrode of the probe 5 µm
- low-noise signal preamplifier with sensitivity better than 0.1 mV
- continuous recording of changes in work function (resolution better than 1 meV)
Responsible body
Group / laboratory / team
Department of Semiconductors Photophysics and Electrochemistry