Trade name
Photoelectric spectrometer
Technical description

The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a measuring electrode in the form of an oscillating golden grid.

Conditions for providing infrastructure

Equipment made available on the terms resulting from the Regulations for the Use of ACMiN Research Infrastructure.

Type of accreditation / certificate:
Not applicable
Access type
Research capabilities

The device is used to test semiconductor materials and allows for:

  • measurement of photocurrent action spectra in a wide range of excitation light wavelengths and working electrode potential,
  • measurement of the work function of the output as a function of the wavelength of the incident light,
  • determination of three-dimensional maps of photocurrents generated by the semiconductor
  • determining the type of conductivity.
Last update date
Aug. 30, 2023, 1:14 p.m.
Year of commissioning
Measurement capabilities

Work parameters:

  • wavelength range: 200-1000 nm
  • working electrode polarization range: ±2 V
  • photovoltage detector sensitivity <1 mV
  • accuracy of setting the measuring electrode of the probe 5 µm
  • low-noise signal preamplifier with sensitivity better than 0.1 mV
  • continuous recording of changes in work function (resolution better than 1 meV)
photoelectric spectrometer
photoelectric spectrometer