Keithley 4200-SCS Semiconductor Characterization System
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through complex characterization tests. All of the functionalities are in a form of graphical user interface – including powerful graphing tools, parameter extractions, simple test sequencing. Current setup includes 4x SMU ( Medium Power Source-Measure Unit) and 1x PMU (Ultra-Fast Pulse I-V Unit).
Equipment is available based on on the terms of using research infrastructure of ACMiN. (https://acmin.agh.edu.pl/home/acmin/5_Wspolpraca/Aparatura/Zasady_i_koszty_korzystania_z_infrastruktury_badawczej_ACMiN.pdf)
Some of the many materials, devices and processes that the 4200-SCS can characterize include:
Graphene, Carbon Nanotubes, Nanowires, LED & OLED, Capacitors, Resistors, Diodes, Solar Cells, MOSFET, BJT, Flash Memories, Non-volatile Memories, Wafer Level Reliability, Failure Analysis, etc.
4200-SMU: can source either voltage or current, and can simultaneously measure both the voltage and current.
- Range: ±210 V, ±100 mA
- Measure resolution: 0.2 μV, 100 fA
4225-PMU: The dual channel unit provides the ultra-fast voltage pulse generation with simultaneous voltage and current measurements.
- Range: ±40 V, ±10 V
- Measure resolution: 75 nA
Responsible body
Group / laboratory / team
Department of Semiconductors Photophysics and Electrochemistry