Keithley 4200-SCS Semiconductor Characterization System
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through complex characterization tests. All of the functionalities are in a form of graphical user interface – including powerful graphing tools, parameter extractions, simple test sequencing. Current setup includes 4x SMU ( Medium Power Source-Measure Unit) and 1x PMU (Ultra-Fast Pulse I-V Unit).
The provision of the equipment requires the prior consent of the supervisor of the device. Sharing takes place on a collaborative basis or for a fee, as part of additional orders. Interpretation of the acquired data is the subject of a separate cooperation agreement. The provision of this device is subject to entries in the timesheet records for scientific and research apparatus.
Some of the many materials, devices and processes that the 4200-SCS can characterize include:
Graphene, Carbon Nanotubes, Nanowires, LED & OLED, Capacitors, Resistors, Diodes, Solar Cells, MOSFET, BJT, Flash Memories, Non-volatile Memories, Wafer Level Reliability, Failure Analysis, etc.
4200-SMU: can source either voltage or current, and can simultaneously measure both the voltage and current.
- Range: ±210 V, ±100 mA
- Measure resolution: 0.2 μV, 100 fA
4225-PMU: The dual channel unit provides the ultra-fast voltage pulse generation with simultaneous voltage and current measurements.
- Range: ±40 V, ±10 V
- Measure resolution: 75 nA
Responsible body
Group / laboratory / team
Semiconductors Photophysics and Electrochemistry Research Group