Keithley 4200-SCS Semiconductor Characterization System

Trade name
Keithley 4200-SCS Semiconductor Characterization System
Technical description

The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through complex characterization tests. All of the functionalities are in a form of  graphical user interface – including  powerful graphing tools, parameter extractions, simple test sequencing. Current setup includes 4x SMU ( Medium Power Source-Measure Unit) and 1x PMU (Ultra-Fast Pulse I-V Unit).

Conditions for providing infrastructure

The provision of the equipment requires the prior consent of the supervisor of the device. Sharing takes place on a collaborative basis or for a fee, as part of additional orders. Interpretation of the acquired data is the subject of a separate cooperation agreement. The provision of this device is subject to entries in the timesheet records for scientific and research apparatus.

Type of accreditation / certificate:
Not applicable
Access type
Research capabilities

Some of the many materials, devices and processes that the 4200-SCS can characterize include:

Graphene, Carbon Nanotubes, Nanowires, LED & OLED,  Capacitors, Resistors, Diodes, Solar Cells, MOSFET, BJT, Flash Memories,  Non-volatile Memories, Wafer Level Reliability, Failure Analysis, etc.

Last update date
Aug. 30, 2023, 1:20 p.m.
Year of commissioning
Measurement capabilities

4200-SMU: can source either voltage or current, and can simultaneously measure both the voltage and current.

  • Range: ±210 V, ±100 mA
  • Measure resolution: 0.2 μV, 100 fA

4225-PMU: The dual channel unit provides the  ultra-fast voltage pulse generation with simultaneous voltage and current measurements.

  • Range: ±40 V, ±10 V
  • Measure resolution: 75 nA
Keithley 4200 SCS
Keithley 4200 SCS