FT-NMT04 in-situ Nanoindenter

The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-based fracture testing; Micro- and nano-tensile testing; Dynamic Mechanical Analysis (DMT); Fatigue tests; Correlative nanomechanical testing and STEM, TKD or EBSD imaging; The FT-NMT04 nanoindenter is a highly precise device that enables a wide range of positioning of the sample relative to the indenter using: a 21mm one-axis piezoelectric actuator with a range of 21mm and positioning precision 1nm (X axis), a 12mm two-axis sample alignment stage (Y and Z axes) with a positioning precision of 1nm, and a one-axis high-resolution piezoelectric scanner (X axis), with a continuous motion in the range of 25um and positioning accuracy of 50pm (noise level of the capacitive position encoder). The use of a dedicated high-resolution displacement scanner, thanks to carrying out tests in the displacement control mode, enables, among others, the detection of phenomena such as activation of dislocation slip. The range and resolution of the force measurement depends on the force microsensor installed, the maximum resolution of 0.5 nN can be achieved with a force range of ± 200 μN, and the maximum force range is ± 200,000 μN with an accuracy of 500 nN. The FT-NMT04 uses indenters integrated with a force microsensor. Available indenter geometries include: Berkovich, cube corner, flat punch and others.