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FT-NMT04 in-situ Nanoindenter

Contact person: Kawałko Jakub
Technical description: The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…

Transmission Electron Microscope

Contact person: Moskalewicz Tomasz
Technical description: The transmission electron microscope is equipped with:  cold field emission gun, accelerating voltage: 60 kV and 200 kV, spherical aberration (Cs) corrector, high angle annular dark field detector (HAADF), selected area all field de…