Equipment
FT-NMT04 in-situ Nanoindenter
Contact person:
Kawałko Jakub
Technical description:
The FT-NMT04 in-situ nanoindenter enables a series of micro-mechanical tests combined with simultaneous observation of the tested sample in a scanning electron microscope (SEM) chamber: Nanoindentation; Micro-pillar compression; Micro-cantilever-bas…
Transmission Electron Microscope
Contact person:
Moskalewicz Tomasz
Technical description:
The transmission electron microscope is equipped with:
cold field emission gun, accelerating voltage: 60 kV and 200 kV,
spherical aberration (Cs) corrector,
high angle annular dark field detector (HAADF),
selected area all field de…
