Ion Milling
Penning-type Ar ion gun, operating at a voltage in the range from 0kV to 6kV Ability to observe the sample during the polishing and cutting process using a stereoscope Sample polishing range: diameter 50 mm, height 25 mm Flat miling mode: -maximum sample size in polishing mode 50mm - range of motion (diameter of the polished area) - X axis: 0-5 mm -beam incidence angle 0°-90° - sample rotation angle ±90° -possibility of sample rotation with selection of rotational speed -possibility of sample oscillation with choice of oscillation angle Cross-section milling mode: - maximum sample size 20mmx20mmx7mm - range of motion - X axis ±7mm - range of motion - Y axis ±3mm - angle of rotation ±3mm - rotation speed of the sample 1 rpm, 25 rpm - cutting speed/efficiency: 500 µm/h (for silicon)
Under contracts and commissioned research tasks/authorization of the head of the IPiAM Department
final polishing, for EBSD, with low-angle shearing (FlatMilling) or for contrasting by high-angle thinning in a few minutes High-quality distortion-free cross-sections for analysis of subsurface structures
Responsible body
Group / laboratory / team
Metallographic laboratory KIPiAM https://kipiam.agh.edu.pl/