Setup for measuring the resistance of thin films using the four-point method in an external magnetic field
The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field of 50 mT.
Equipment is available based on on the terms of using research infrastructure of ACMiN. (https://acmin.agh.edu.pl/home/acmin/5_Wspolpraca/Aparatura/Zasady_i_koszty_korzystania_z_infrastruktury_badawczej_ACMiN.pdf)
The nanoMeter system can be used for general resistivity measurements, it is designed primarily for nanowires and nanolayers. It applies an electric current I to a sample in a four electrode setup, and measures the generated voltage V. The resistance R is then determined from the Ohm’s law: R = V/I. The resistance of a sample can be measured in an external magnetic field or in variable temperatures.
Maximum current: Imax = 100 mA
Current ranges: 100 mA, 10 mA, 1 mA, 100 μA, 10 μA, 1 μA, 100 nA, 10 nA
Range of resistance measurements: [1mOhm to 1GOhm]
Voltage ranges: 2 V, 1 V, 0.5 V, 0.25 V, 0.125 V, 1/16 V, 1/32 V.
Highest possible voltage resolution: 2 nV
Magnet current range: -0.5 A to 0.5 A
Heater current range: -100 mA to 100 mA
Responsible body
Group / laboratory / team
Department of Functional Materials and Nanomagnetism