Setup for measuring the resistance of thin films using the four-point method in an external magnetic field
The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field of 50 mT.
Equipment is available based on on the terms of using research infrastructure of ACMiN.
The nanoMeter system can be used for general resistivity measurements, it is designed primarily for nanowires and nanolayers. It applies an electric current I to a sample in a four electrode setup, and measures the generated voltage V. The resistance R is then determined from the Ohm’s law: R = V/I. The resistance of a sample can be measured in an external magnetic field or in variable temperatures.
Maximum current: Imax = 100 mA
Current ranges: 100 mA, 10 mA, 1 mA, 100 μA, 10 μA, 1 μA, 100 nA, 10 nA
Range of resistance measurements: [1mOhm to 1GOhm]
Voltage ranges: 2 V, 1 V, 0.5 V, 0.25 V, 0.125 V, 1/16 V, 1/32 V.
Highest possible voltage resolution: 2 nV
Magnet current range: -0.5 A to 0.5 A
Heater current range: -100 mA to 100 mA
Responsible body
Group / laboratory / team
Functional Materials and Nanomagnetism