Scanning Probe Microscope
Operating modes: AFM – Atomic Force Microscopy LFM – Lateral Force Microscopy MFM – Magnetic Force Microscopy EFM – Electric Force Microscopy PFQNM - PeakForce Quantitative Nano-Mechanical Mapping Area of analysis XY from max 100 μm x 100 μm to min several nm x several nm Range of analysis in Z direction up to max 9.5 μm Resolution max to 1 nm depending on the operation mode and the type of the probe
Under contracts and commissioned research tasks/authorization of the head of the IPiAM Department
Determination of 3D surface topography (roughness parameters) - AFM Imaging the distribution of: • micro-areas with different coefficients of friction - LFM • magnetic microdomains - MFM • micro-areas with different electrical properties - EFM • micro-areas with different mechanical interaction of the tested surface with the probe tip: adhesion, deformation, Young's modulus.
Determination of 3D surface topography (roughness parameters) - AFM Imaging the distribution of: • micro-areas with different coefficients of friction - LFM • magnetic microdomains - MFM • micro-areas with different electrical properties - EFM • micro-areas with different mechanical interaction of the tested surface with the probe tip: adhesion, deformation, Young's modulus.
Responsible body
Group / laboratory / team
Characterization of Materials Laboratory KIPiAM https://kipiam.agh.edu.pl/