Equipment
Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) Rigaku ZSX Primus IV
Contact person:
Mech Krzysztof
Technical description:
The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U.
Specification:
Analyzed elements range: Be – U (Z = 4 &ndas…
HPR-20 R&D quadrupole mass spectrometer (MS)
Contact person:
Kmita Angelika
Technical description:
HPR-20 R&D (MS) quadrupole mass spectrometer coupled with TA Instruments (TG) Q600 thermogravimeter. The TG/DSC-MS system enables qualitative and quantitative analysis of released gases and vapors emitted during sample heating (in the temperatur…
UHPLC-MS/MS
Contact person:
Koziarska Marta
Technical description:
The UHPLC-MS/MS system is a combination of ultra-high-performance or high-performance liquid chromatography with a tandem mass spectrometer, using the resolving power of the analytical method and the ability of mass spectrometry to identify separate…
Wavelength dispersive X-ray fluorescence spectrometer (WD-XRF) ZSX Primus II
Contact person:
Bajda Tomasz
Technical description:
The ZSX Primus II RIGAKU X-ray Fluorescence Wave Dispersion Spectrometer (WDXRF) enables qualitative and quantitative analysis of elements in the range from nitrogen (N) to uranium (U) (Z = 7 - 92).
Spectrometer characteristics:
X-ray tube …
Inductively Coupled Plasma Mass Spectrometer (ICP-MS)
Contact person:
Kmiecik Ewa
Technical description:
Inductively coupled plasma mass spectrometer model iCAP RQ (C2) with collision/reaction chamber (Thermo Scientific).
A choice of three inserts allow the user to balance the needs of matrix resistance against absolute sensitivity: "robust&quo…
Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES)
Contact person:
Kmiecik Ewa
Technical description:
Inductively Coupled Plasma Optical Emission Spectrometer model Optima 7300DV (Perkin Elmer).
Plasma can be observed in two directions, in the so-called dual view system (axial and radial). The use of two semiconductor detectors (one for UV, one f…
