Equipment
Atomic force microscope combined with nanoindenter
Contact person:
Szuwarzyński Michał
Technical description:
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…
Skaner 3D - Gom2
Contact person:
Perzyński Konrad
Technical description:
The GOM Scan 1 non-contact scanner is an advanced device based on GOM's blue light technology and rod projection used in reverse engineering for digitizing analyzed products and objects. GOM Scan 1 is equipped with advanced Blue Light technology…