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Skaner 3D - Gom2

Contact person: Perzyński Konrad
Technical description: The GOM Scan 1 non-contact scanner is an advanced device based on GOM's blue light technology and rod projection used in reverse engineering for digitizing analyzed products and objects. GOM Scan 1 is equipped with advanced Blue Light technology…

Atomic force microscope combined with nanoindenter

Technical description: The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…