Equipment
Atomic force microscope combined with nanoindenter
Contact person:
Szuwarzyński Michał
Technical description:
The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…
