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Metallographical microscope (clean room) Nikon Eclipse LV150N

Contact person: Chrobak Maciej
Technical description: The light microscope (LM) allows imaging in reflected light in bright field (BF), dark field (DF), polarised light (POL) and reflected light. field (BF). It has a fully motorized stage (X,Y,Z), allowing automatic taking pictures in extended depth of…

Atomic force microscope combined with nanoindenter

Technical description: The Atomic Force Microscope (AFM) Bruker Dimension ICON XR is a versatile, low noise probe scanning microscope. The maximum scanning area is limited to 90×90 μm in the horizontal range and up to 10 μm in the vertical range. The microscop…