Export results


Setup for measuring the resistance of thin films using the four-point method in an external magnetic field

Technical description: The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field…

Spectroscopic ellipsometer

Contact person: Mazur Tomasz
Technical description: The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …