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Scanning electron microscope FEI Quanta 200 FEG

Contact person: Bajda Tomasz
Technical description:  High-resolution scanning electron microscope with hot field emission (FEG - highly stable Schottky electron emitter),  magnification 70 ÷ 300,000x Technical parameters: Accelerating voltage 5 - 30 kV Variable vacuum syst…

Wavelength dispersive X-ray fluorescence spectrometer (WD-XRF) ZSX Primus II

Contact person: Bajda Tomasz
Technical description: The ZSX Primus II RIGAKU X-ray Fluorescence Wave Dispersion Spectrometer (WDXRF) enables qualitative and quantitative analysis of elements in the range from nitrogen (N) to uranium (U) (Z = 7 - 92). Spectrometer characteristics: X-ray tube …

Electron Microprobe Jeol SuperProbe JXA-8230

Contact person: Piestrzyński Adam
Technical description: The JEOL SuperProbe 8230 electron microprobe equipped with: - 5 wavelength X-Ray spectrometers (WDS) equipped with 12 diffracting crystals (LIF, LIFL, LIFH, TAP, TAPH, PETL, PETH, PETJ, LDE1, LDE2, LDE3); - Energy-dispersive X-ray spectrometer…

Atomic absorption spectrometer AAS

Contact person: Bajda Tomasz
Technical description: AAS atomic absorption spectrometer for chemical composition analyses of solutions - elements from Li to U. The spectrometer has features such as a programmable gas box, eight tubes with automatic tube settings, wavelength and slit width optimisat…