Equipment

Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)

Entity: Academic Centre for Materials and Nanotechnology

Technical description: Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…

Keywords: EDS Electron microscopy TEM