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Transmission electron microscope (TEM) Tecnai TF 20 X-TWIN (FEI)

Contact person: Gajewska Marta
Technical description: Tecnai TF 20 X-TWIN (200 kV) is a high-resolution transmission electron microscope equipped with a Field Emission Gun (FEG). The microscope enables imaging of the microstructure of a wide range of materials (such as: metals and their alloys, ceramic…