Export results


Ion polisher and sprayer

Contact person: Wroński Sebastian
Technical description: The key factor that determines the quality of the images obtained using SEM electron microscopy is the appropriate preparation of samples. Generally, specimens are prepared by grinding, polishing, and etching. The electron backscattering technique (…

Argon ion milling system for samples flat milling or cross-section preparation

Contact person: Tokarski Tomasz
Technical description: The ion polisher is a device used for precision polishing of flat surfaces as well as for cross-sectioning metallic, ceramic and polymer materials. The device is capable to work with samples up to 50 mm in diameter at ion energies up to 6 keV. It is…