Equipment
Photoelectric spectrometer
Contact person:
Podborska Agnieszka
Technical description:
The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …
Keithley 4200-SCS Semiconductor Characterization System
Contact person:
Mazur Tomasz
Technical description:
The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …
Ambient Kelvin Probe
Contact person:
Szaciłowski Konrad
Technical description:
The ambient Kelvin probe is used to measure the work function of conductive materials.
UV-Vis-NIR spectrophotometer Lambda 750 PerkinElmer
Contact person:
Podborska Agnieszka
Technical description:
The spectrometer has two measurement chambers enabling the measurement of liquid samples and solids. It is equipped with an integrating sphere with a diameter of 60 mm for measuring reflection coefficient and transmission in solids and powders.
M…