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UV-Vis-NIR spectrophotometer Lambda 750 PerkinElmer

Contact person: Podborska Agnieszka
Technical description: The spectrometer has two measurement chambers enabling the measurement of liquid samples and solids. It is equipped with an integrating sphere with a diameter of 60 mm for measuring reflection coefficient and transmission in solids and powders. M…

Ambient Kelvin Probe

Contact person: Szaciłowski Konrad
Technical description: The ambient Kelvin probe is used to measure the work function of conductive materials.

Keithley 4200-SCS Semiconductor Characterization System

Contact person: Mazur Tomasz
Technical description: The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …

Photoelectric spectrometer

Contact person: Podborska Agnieszka
Technical description: The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …