Equipment
Differential scanning calorimeter SDT Q600 by TA INSTRUMENTS
Contact person:
Kmita Angelika
Technical description:
Analyzer for DSC differential scanning calorimetry and TG thermogravimetry.
DualBeam High-resolution Scanning Electron Microscop with Gallium Focused Ion Beam (FIB/SEM)
Contact person:
Berent Katarzyna
Technical description:
FEI Versa 3D double-beam high-resolution scanning electron microscope equipped with a Field Emission Gun (FEG) and a Focused Ion Beam (FIB). It enables operation with accelerating voltage in the range from 500 V to 30 kV (max. electron beam current …
DualBeam Ultra-high-resolution Scanning Electron Microscop with Xenon (Xe) Plasma Focused Ion Beam (PFIB/SEM) with Atomic Force Microscope (AFM)
Contact person:
Berent Katarzyna
Technical description:
Helios 5 is a double-beam ultra-high-resolution scanning electron microscope equipped with a high-stability Schottky Field Emission Gun (FEG) and a Plasma Focused Ion Beam (PFIB). It enables operation with accelerating voltage in the range from 350 …
Rotational rheometer Physica MCR 302 by ANTON PAAR
Contact person:
Kmita Angelika
Technical description:
The Physica MCR 302 rotational rheometer from Anton Paar is a device used to test the rheological properties of various materials. It allows you to perform analyzes (rheological tests) under conditions of constant shear rate (CSS) or constant shear …
Turbomolecular pumped coater Q150T E Quorum Technologies
Contact person:
Berent Katarzyna
Technical description:
The device enables the deposition of high-purity, high-density amorphous carbon (C) thin films on the surface of non-conductive samples to improve the electrical conductivity of samples analyzed using scanning electron microscopy (SEM), transmission…
High speed mixer
Contact person:
Berent Katarzyna
Technical description:
The device is used for the rapid mixing and grinding of materials. Suspensions can be homogenously mixed in seconds.
Integrated Mossbauer Measurement System
Contact person:
Cieślak Jakub
Technical description:
Standard spectrometric track with a proportional (Xenon) detector and software.
VSM magnetometer with cryostat
Contact person:
Szkudlarek Aleksandra
Technical description:
Vibrating sample magnetometer, LakeShore 7407 VSM, is equipped with continuous flow cryostat and owen. It is capable to probe DC magnetization as a function of temperature and external magnetic field. Temperature dependent measurements can be perfor…
Setup for measuring the resistance of thin films using the four-point method in an external magnetic field
Contact person:
Szkudlarek Aleksandra
Technical description:
The Nanometer 1.0 device allows for measuring the resistance and current-voltage characteristics of thin films using the four-point method in the mOhm to MOhm range. It is also possible to measure magnetoresistance by applying a small magnetic field…
Plasma cleaner Harrick PDC-32G Plasma Cleaner
Contact person:
Szkudlarek Aleksandra
Technical description:
Plasma Cleaner is used to clean the surface of samples from impurities of organic origin or to activate the surface. The FlowMeter apparatus allows the application of oxygen or argon and their mixtures to generate plasma with a simulataneous control…
