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HB05 Bonder with microscope and heater

Contact person: Chrobak Maciej
Technical description: The HB05 Bonder equipped with an optical microscope and a heating stage, allows to make metallic connections between sample holder and sample using gold or aluminum wire with a thickness of 25 µm.

Metallographical microscope (clean room) Nikon Eclipse LV150N

Contact person: Chrobak Maciej
Technical description: The light microscope (LM) allows imaging in reflected light in bright field (BF), dark field (DF), polarised light (POL) and reflected light. field (BF). It has a fully motorized stage (X,Y,Z), allowing automatic taking pictures in extended depth of…

Magnetron sputtering system Leica EM ACE600

Contact person: Jabłoński Piotr
Technical description: High vacuum magnetron sputtering system Lecia EM ACE600 for deposition of thin films from two independent metal target sources. The sputtering system contains: inner, integrated oil-free diaphragm pump and turbomolecular pump, two independen…

Vacuum system for thin films sputtering and nanoparticles deposition

Contact person: Jabłoński Piotr
Technical description: The deposition system consists of two vacuum chambers made by Mantis, which fulfil the conditions of high vacuum (HV). The first chamber enables the deposition of metal or metal oxide nanoparticles by means of the Inert Gas Condensation (IGC) method…

Pulsed Laser Deposition System

Contact person: Jabłoński Piotr
Technical description: The system allows the fabrication of thin films of a specified stoichiometric or supersaturated composition with thicknesses ranging from a few nanometers to a few micrometers, on a variety of substrates (metallic, ceramic, polymeric). Substrates ca…

High-resolution electron beam lithography system

Contact person: Jabłoński Piotr
Technical description: The Class 100 clean room houses the electron lithography unit (Raith eLine+). The system consists of an electron gun, a secondary electron detector, an in-lens detector, a laser interferometer, control electronics, and a pump system to maintain adeq…

Profilometer for measuring nanometer-sized layers

Contact person: Jabłoński Piotr
Technical description: Contact needle profilometer for testing surface roughness and waviness with a resolution of 1 A and a repeatability of 4 A≤ (angstrom).

Ion etching and layer deposition system

Contact person: Jabłoński Piotr
Technical description: The Class 1000 clean room houses the Microsystems IonSys 500 ion etching and thin film deposition device. The system is equipped with an ion gun along with a SIMS detector, which enables the etching of thin films with nanometer precision, and a magn…

Dilution refrigerator with magnet

Contact person: Chrobak Maciej
Technical description: The 3He/4He dilution refrigerator operating in a closed cycle allows reaching and stabilizing temperatures in the range from 10 mK to 30 K. Cooling power at 100 mK is 200 μW, and at 20 mK is 4 μW. The integrated superconducting magnet allows t…

Low-temperature scanning tunneling microscope

Contact person: Trembułowicz Artur
Technical description: The scanning tunneling microscope belongs to the family of scanning probe microscopes and allows us to study surfaces with atomic resolution. It works based on the quantum phenomenon of electrons tunneling through a barrier that they could not overc…