Filters

Export results

Equipment


UV-Vis-NIR spectrophotometer Lambda 750 PerkinElmer

Contact person: Podborska Agnieszka
Technical description: The spectrometer has two measurement chambers enabling the measurement of liquid samples and solids. It is equipped with an integrating sphere with a diameter of 60 mm for measuring reflection coefficient and transmission in solids and powders. M…

LED control system

Contact person: Podborska Agnieszka
Technical description: The LED controller is a device that controls LEDs with a power of up to 100 mW. The set of diodes includes LEDs with light wavelengths: 365, 385, 405, 460, 510, 530, 620, 660, 735, 860, 940 nm, as well as white light diodes (3000K, 4000K, 10,000K). …

Dual-beam laser - photoelectric spectrometer

Contact person: Podborska Agnieszka
Technical description: Light source: two Opolette 355 lasers with an Nd:YAG pump equipped with optical parametric oscillators (OPO) tunable in the range of 210-2400 nm with a peak pulse power of 500 kW. Detection system: Zahner-Elektric IM6 electrochemical workstation …

Potentiostat/galvanostat Biologic SP-300

Contact person: Mech Krzysztof
Technical description: Two channel potentiostat/galvanostat BioLogic SP-300 with EIS module enabling fundamental electrochemical measurements, testing of electrocatalytic materials, analysis of kinetics and mechanism of electrode processes as well as synthezis of metallic…

FTIR spectrometer for measuring infrared spectra

Contact person: Podborska Agnieszka
Technical description: The Bruker Tensor II FTIR spectrometer is equipped with: attachment for measurements of Attenuated Total Reflectance (ATR) with a monolithic diamond crystal enabling measurement in the range of 350-8000 cm-1, adapted to the measurement of…

Keithley 4200-SCS Semiconductor Characterization System

Contact person: Mazur Tomasz
Technical description: The Keithley Model 4200-SCS is a modular fully integrated parameter analyzer that performs electrical characterization of materials and semiconductor devices and The 4200-SCS software provides a unified measurement interface that guides you through …

Photoelectric spectrometer

Contact person: Podborska Agnieszka
Technical description: The measuring system consists of a digitally controlled light source (XBO150 xenon lamp, monochromator, set of edge filters, shutter, light intensity stabilization system), a calibrated photodiode, a dedicated potentiostat and a Kelvin probe with a …

Wavelength dispersive X-ray fluorescence spectrometry (WD-XRF) Rigaku ZSX Primus IV

Contact person: Mech Krzysztof
Technical description: The ZSX Primus IV is a wavelength dispersion XRF spectrometer for qualitative, semi-quantitative and quantitative elemental analysis. It is able to detect elements from Be to U. Specification: Analyzed elements range: Be – U (Z = 4 &ndas…

GC-MS/TCD Gas Chromatograph – Shimadzu GCMS-QP2020(EI)

Contact person: Mech Krzysztof
Technical description: Gas chromatograph equipped with MS and TCD detectors intended for qualitative and quantitative analysis of gas phase composition. Configuration: MS – carrier gas: He, column: Agilent J&W HP-PLOT/U; l=30m; d=0.53 mm, temperature range…

Spectroscopic ellipsometer

Contact person: Mazur Tomasz
Technical description: The SER-850 spectroscopic ellipsometer is an ultraviolet to near infrared device for measuring the thickness and basic optical properties of thin films and multilayered structures. The device allows both routine and advanced measurements of optical …