Equipment
Scanning Electron Microsocpe JEOL JSM-6490LA
Contact person:
Wroński Sebastian
Technical description:
The JEOL JSM-6490LA scanning electron microscope with a LaB6 electron gun and an ion pumping system. The microscope is equipped with both backscattered electron (BSE) and secondary electron (SE) detectors, as well as an EBSD (Electron Back Scattered…
